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Displaying 761 - 780 of 976SFAC334
For the generation and calculation of the X-ray structure factors and the real and imaginary parts of the structure factors of any crystalline system.Plus additional jobs.
SFAC334
For the generation and calculation of the X-ray structure factors and the real and imaginary parts of the structure factors of any crystalline system. Many more functions.
SgInfo
A comprehensive collection of ANSI C routines for the handling of space group symmetry from Switzerland's ETH.
SHADE
Estimates anisotropic displacement parameters for hydrogen atoms by combining a rigid-body analysis of the non-hydrogen-atom anisotropic displacement parameters (ADPs) with a contribution from internal atomic motion.
Bibliography:Asset ID: 50667
Bibliographic Reference: Madsen, A. Ø. (2006). J. Appl. Cryst. 39, 757–758.
SHADE3
The SHADE web server has been updated to allow the use of ab initio calculations and experimental information. The resulting H-atom anisotropic displacement parameters are compared with neutron structures and other estimation approaches.
Application Area: Structure
Asset ID: 121185
Bibliographic Reference: Madsen, A.Ø. & Hoser, A.A. (2014). J. Appl. Cryst. 47, 2100-2104
DOI: https://doi.org/10.1107/S1600576714022973
Submitter: ab
SHADOW
Powder program. Peak fitting, see CCP14
ShakePSD
To solve the structures of organic compounds automatically. Can discriminate whether a heavy-atom is included or not and can employ heavy-atom methods (Patterson function and search for all remaining atoms) or direct methods (tangent formula and/or minimal function).
SHAPE
Drawing the external morphology (faces) of crystals and quasi-crystals. Also drawing of sections of crystals. The Professional edition (Windows only) includes two capabilities beyond those of the standard edition: quasi-crystals and sections/growth-zones.
Shape_CCMS
Analysis of structure and chemistry at the molecular surface.
Shark frame grabber
high quality digitisation of an image or diffraction pattern.
SHARP
A Statistical Heavy Atom Refinement and Phasing program
SHELX-97
Set of programs for crystal structure determination from single-crystal diffraction data. Runs on all systems including DOS. See also SHELXS for PC versions.
SHELXL2013
Some of the improvements in SHELX2013 make SHELXL convenient to use for refinement of macromolecular structures against neutron data without the support of X-ray data.
Application Area: Biology
Asset ID: 110446
Bibliographic Reference: Gruene, T., Hahn, H. W., Luebben, A. V., Meilleur, F. & Sheldrick, G. M. (2014). J. Appl. Cryst. 47, 462-466.
DOI: https://doi.org/10.1107/S1600576713027659
Submitter: ab
ShelXle
ShelXle is a graphical user interface (GUI) for SHELXL.
It combines an editor with syntax highlighting feature and a OpenGL visualization of the structure including electron density maps. The GUI is written in C++ using the Qt4 library and the Fourier transformation for the map is done using FFTW3 library.Application Area: Chemistry, Graphics, Structure, Structure determination, Visualization
Asset ID: 59885
Bibliographic Reference: C. B. Hübschle, G. M. Sheldrick & B. Dittrich (2011). J. Appl. Cryst. 44, 1281-1284.
DOI: https://doi.org/10.1107/S0021889811043202
Submitter: Christian B. Huebschle
SHELXS
PC version (DOS and Windows) of the structure solution program SHELXS-86 by G. Sheldrick. Availability is restricted to registered users only. For registration as well as for versions for others systems. see SHELX-97.
Shift_plot
Shift_plot may be useful for visual analysis of magnitudes of atomic shifts in refinement.
Application Area: Biology
Asset ID: 87783
Bibliographic Reference: Sobolev, O. V. (2013). J. Appl. Cryst. 46, 554-559.
DOI: https://doi.org/10.1107/S0021889812052065
Submitter: ab
SIFT_PyOCL
Program to enable image stack alignment in full-field X-ray absorption spectroscopy
SImPA
SImPA(Simplified Imaging Plate Analysis / version 1.3) provides the necessary tools to process a powder X-ray diffraction image recorded on a phosphor imaging plate for further analysis as follows: (1) Image display and manipulation, e.g. pixel intensity readout, image enhancement and enlargement; (2) Sample-to-plate distance calibration for the analysis of the X-ray diffraction image; (3) Imaging plate orientation correction; (4) Removal of spurious high intensity spots (e.g. Bragg spots from large single grains); (5) Azimuthal summation of pixel intensities for the construction of a high signal-to-background intensity profile as a function of the diffraction angle. SImPA offers an easy-to-use interface. A working version of SImPA (version 1.3) is available free of charge for evaluation. Contact Serge Desgreniers (sdesgren@uOttawa.ca) for further information.
Application Area: Characterization, Diffraction, Graphics, Materials science, Minerals, Powder, Virtual reality, Visualization
Asset ID: 50855
SIMPLEX
Simulator and postprocessor for free-electron laser experiments
Application Area: Instrumentation
Asset ID: 121125
Bibliographic Reference: Tanaka, T. (2015). J. Synchrotron Rad. 22, 1319-1326
DOI: https://doi.org/10.1107/S1600577515012850
Submitter: ab
SIMPRO
Full Powder Pattern Fitting Program. Refinement of multible phases, of the wave vector components of a modulated structures, Lorentz polarisation...
Application Area: Chemistry, Diffraction, Materials science, Structure determination
Asset ID: 50835
Bibliographic Reference: Ihringer, J. (1995). J. Appl. Cryst. 28, 618–619.